Laatste wijziging: March 09 2017 11:18:49.

XMI instrumentation

The XMI research group applies both laboratory and synchrotron radiation sources for spatially resolved, highly sensitive multi-elemental analysis on the micro/nanoscopic level of a variety of samples. Below, an overview is presented regarding the available laboratory instrumentation together with several key-papers:


A laboratory XRF microprobe is equipped with an air-cooled X-ray tube with a Rh anode, a polycapillary lens (X-ray Optical Systems, XOS, USA) for X-ray focusing and an 80 mm² energy dispersive Si(Li) detector cooled by liquid nitrogen. The EDAX EagleIII allows to investigate the major/minor elemental distribution with an X-ray beam size down to 20 µm under ambient or vacuum conditions. As the instrument can be operated under vacuum, the attenuation of low energy X-rays by air is eliminated, resulting in the possibility for low Z element analysis down to Na.

Key papers:

Gholap, et al., Analytica Chimica Acta, 2010

Van de Voorde, et al., Spectrochimica Acta Part B, 2014

MicroXRF spectrometer

A second micro-XRF scanning instrument has been developed in-house and has been named the MicroXRF spectrometer. The laboratory microprobe applies a Mo X-ray tube equipped with DCC optics in order to obtain a micro-focussed, monochromatic beam, yielding a good spatial resolution coupled with an excellent sensitivity.

Key papers:

Garrevoet, et al., Analytical Chemistry, 2015


Currently a cooperation between the UGCT and XMI research groups is running to develop and construct a multi-method X-ray based imaging instrument, integrating three different non-destructive 3D microanalysis techniques. These will include two XRF-based methodologies: XRF tomography and a confocal XRF station. The instrument, named Heracles, will be up-and-running in the fall of 2015.

Surface Monitor

Next to these instruments which remain in the laboratory environment, the XMI group has access to a mobile XRF/XRD setup for in situ analysis of e.g. cultural heritage objects (Surface Monitor, Assing S.p.A, Italy). The Surface Monitor allows both elemental analysis and phase identification.

Key papers:

Van de Voorde, et al., Spectrochimica Acta Part B, 2015

Besides, the XMI research group also has access to two other laboratory XRF setups to perform specialized measurements, namely a PANalytical Epsilon3 instrument for bulk elemental analysis and a TXRF setup (TX2000, GNR) for trace elemental analysis down to the ppb level.